clairex technologies, inc. 1301 east plano parkway plano, texas 75074-8524 phone: 972-265-4900 fax: 972-265-4949 www.clairex.co m CL9P5LQ epoxy-encapsulated photoconductors (replaces the cl9p5l) clairex ? technologies, inc . novembe r , 2003 features ? thicker ceramic substrate ? low cost epoxy encapsulation description the CL9P5LQ consists of cds base material deposited on a ceramic substrate and epoxy encapsulated. the CL9P5LQ is electrically equivalent to, and replaces, the cl9p5l and cl905l. for applications assistance, call clairex. absolute maximum ratings (t a = 25c unless otherwise stated) storage and operating temper ature ??????????????.-50c to +75c lead soldering temperature (1) ?????????????????????.260c power dissipation at 25c air temperature???????????????.50mw ` notes: 1. 0.06? (1.5mm) from the case for 5 seconds maximum. 2. the CL9P5LQ has a 0.079? thick subs trate and 1.0? minimum length leads. the cl9p5l had a 0.055? thick substr ate and 1.4? minimum length leads. clairex reserves the right to make changes at any time to improve design and to provide the best possible product. ? electrical characteristics (t a = 25c unless otherwise noted) part number material type r on (1)(2) ? (typ) r off (3) ? (min.) v meas (4) volts v (max) volts CL9P5LQ cds,cdse 10k 670k 10 100 notes : 1. on-resistance (r on ) is measured at 2 ft-c after light stabilization at 30 ft-c for 16 hours minimum just prior to test. r on tolerance is 33% at 2 ft-c. 2. light source for all r on measurements is an unfiltered tungsten s ource operating at a color temperature of 2854k. 3. off-resistance (r off ) is measured under dark conditions, 5 seconds after r on test. a dark condition is reached when the value of r off can not be increased by further irradiation shielding. 4. measurement voltage (v meas ) is the steady-state bias applied to the device for measurement of r on and r off . all dimensions are in inches pattern shown is typical and may vary from part to part. revised 3/15 / 06
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