| PART |
Description |
Maker |
| 44242-0001 44242-0002 44242-0003 44242-0004 44242- |
Micro-Fit 3.0垄芒 Test Plugs Won隆炉t Damage Mating Contact
Micro-Fit 3.0 Test Plugs Won’t Damage Mating Contact
|
Molex Electronics Ltd.
|
| BS0640N-C-F |
Eliminates overvoltage caused by fast rising transients
|
Shenzhen Bencent Electr...
|
| BS0300N-2C |
Eliminates overvoltage caused by fast rising transients
|
Shenzhen Bencent Electr...
|
| BS0060U-2G |
Eliminates overvoltage caused by fast rising transients
|
Shenzhen Bencent Electr...
|
| BS3500N-C-F |
Eliminates overvoltage caused by fast rising transients
|
Shenzhen Bencent Electr...
|
| HD6433434F12 HD6433434F16 HD6433434TF12 HD6433434T |
12 V must not be applied to the S-mask model (single-power-supply specification), as this may permanently damage the device.
|
Hitachi Semiconductor
|
| HS-A1420-10 |
offering RFI shielding, and are designed to survive standard wave soldering operations without damage
|
Nel Frequency Controls,...
|
| TC670ECHTR TC67003 TC670 |
The TC670 is an integrated fan speed sensor that predicts and/or detects fan failure, preventing thermal damage to systems with cooling fans. When the fan speed falls below a user specified level, the TC670 asserts an ALERT signal. With th
Tiny Predictive Fan Failure Detector
|
Microchip Technology
|
| TC1413 TC1413N TC1413NCOA TC1413NCOA713 TC1413NEUA |
3A High-Speed MOSFET Drivers
The TC1413/1413N are 3A CMOS buffer/drivers. They will not latch up under any conditions within their power and voltage ratings. ...
The TC1413/1413N are 3A CMOS buffer/drivers. They will not latch up under any conditions within their power and voltage ratings. They are not subject to damage when up to 5V of noise spiking of either polarity that occurs on the ground pin
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http://
Microchip
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