| PART |
Description |
Maker |
| TLP3111-14 |
Measurement Instruments Logic IC Testers / Memory Testers Board Testers / Scanners
|
Toshiba Semiconductor
|
| TLP3113 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS MEMORY TESTERS BOARD TESTERS SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP311307 TLP3113 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| CAT28F010 CAT28F010TI-70T CAT28F010PI-70T CAT28F01 |
120ns 2M-bit CMOS flash memory
90ns 2M-bit CMOS flash memory
70ns 2M-bit CMOS flash memory
1 Megabit CMOS Flash Memory
High Speed CMOS Logic 8-Stage Shift-and-Store Bus Register with 3-Stage Outputs 16-PDIP -55 to 125
|
http://
CATALYST[Catalyst Semiconductor]
|
| TLP354207 |
TESTERS DATA RECORDING EQUIPMENTS
|
Toshiba Corporation
Toshiba Semiconductor
|
| XC17S50APDG8C XC17S50ASO20C |
XC2S50 PROM C grade 559200 X 1 CONFIGURATION MEMORY, PDIP8
SERIAL PROM FOR 50000 SYSTEM GATE LOGIC 559200 X 1 CONFIGURATION MEMORY, PDSO20
|
Xilinx, Inc.
|
| AT29LV512-25TI AT29LV512-25TC AT29LV512-25JI |
512K 64K x 8 3-volt Only CMOS Flash Memory
High Speed CMOS Logic Quad 2-Input NAND Gates 14-PDIP -55 to 125
High Speed CMOS Logic 4-Bit Binary Ripple Counter 14-SOIC -55 to 125
|
Atmel Corp.
|
| A-1855-06111-UNILAP100E |
INSTALLATION TESTER 安装测试
|
Omron Electronics, LLC
|
| 010-0133 |
BNC TESTER (ELECTRICAL)
|
List of Unclassifed Manufac...
|
| RX1700-2.5 |
ECG Smoke Detector Tester
|
NTE[NTE Electronics]
|
